Nanometrology France 2016 Conference and Exhibition

NanoMetrology 2016
01 Jun - 03 Jun 2016 | Paris- France
Conference Topics

 

The NanoMetrology France 2016 topics include, but not limited to :

 

  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
  • Divulgation of good laboratory practice and traceability in nanoscale metrology
  • Modeling and simulations for nanometrology
  • Society and regulation issues