Nanometrology 2020 International Conference and Exhibition

NanoMetrology 2020
24 Jun - 26 Jun 2020 | Paris - France
The 6th edition of NanoMetrology 2020 International Conference & Exhibition

Metrology, from the Ancient Greek metron (measure) and logos (study of), is the science of measurement. Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today's global economy depends on reliable measurements and tests, which are trusted and accepted internationally. This measurement infrastructure must be extended into the nanoscale and beyond, to bring nanotechnology based products or manufacturing processes successfully and safely into the market place.

 

The 6th edition of NanoMetrology 2020 event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterization of nanomaterials and realization of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology. The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterization of nanomaterials, nanosystems, and nanodevices at the nanometer scale. The event topics include, but not limited to:

 

  • Characterisation at the nanoscale
  • Modeling and simulations at the nanoscale
  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
  • Divulgation of good laboratory practice and traceability in nanoscale metrology
  • Nanosafety/ Nanotoxicity; Sustainable nanomanufacturing; Environmental Metrology, Biomedical/phamaceutical  (Eco-toxicological, Clinical) Metrology, Food Metrology, etc
  • Society and regulation issues

 

Detailed topics and sessions:

 

Session 1: Characterization at the nanoscale

  • State of the art of measurement at the nanoscale level
  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Nanotribology, Surface nanometrology/ 3D printing, etc
  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings)
  • New and emerging measurement and analysis technologies, and recent advances in standards and regulatory frameworks
  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nano-systems

 

Session 2: Standards for nanometer scale Characterization

  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
  • Divulgation of good laboratory practice, Traceability, uncertainty, calibration, verification, etc
  • Precision instrumentation design and theory; optical instruments; scanning probe microscopies; particle beam microscopy; surface topography measurement; and aspects of in-line measurement

 

Session 3: Modeling and simulations at the nanoscale

  • New developments in modeling and simulations at the nanoscale
  • Emerging control theory and applications

 

Session 4: Nanosafety/ Nanotoxicity, Society and regulation issues

  • NanoToxicology
  • Sustainable nanomanufacturing
  • Risk assessment and management
  • Measurement of health risk/ Exposure scenarios
  • Regulation and ethical impacts/ Scientific Policy
  • Interface between development of new technology and global justice

 

General Chairs
Prof. Jacques Jupille-The 6th edition of NanoMetrology 2020 International Conference & Exhibition
Institut des Nanosciences de Paris-Université Pierre et Marie Curie (UPMC) – CNRS Paris, France
Prof. James M Hill-The 6th edition of NanoMetrology 2020 International Conference & Exhibition
University of South Australia, Australia
Keynote Speakers
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New University of Lisbon, Portugal
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University of Aveiro, Portugal
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Nova University of Lisbon, Portugal
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University of Newcastle, Australia
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The State University of New Jersey, USA
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University of Cadiz, Spain
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Aix-Marseille University, France
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Institute of Nanotechnology - CNR-NANOTEC, Italy
Media Partners
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