Nanometrology 2020 International Conference and Exhibition
23 - 25 Jun 2020 | Paris France
Qingze Zou received the bachelor degree in automatic control from the University of Electronic Science and Technology of China, in 1994, the M.S. degree in mechanical engineering from Tsinghua University, Beijing, China, in 1997, and the Ph.D. degree in mechanical engineering from the University of Washington, Seattle, WA, USA, in 2003.He is a Professor in the Mechanical and Aerospace Engineering Department, Rutgers, the State University of New Jersey, USA. Previously he had taught in the Mechanical Engineering Department of Iowa State University. His research interests are in advanced control tools for high-speed scanning probe microscope imaging, rapid broadband nanomechanical property measurement and mapping of soft and live biological materials, probe-based nanomanufacturing, micro-machining, and stomatal dynamics characterization and modeling. Prof. Zou received the NSF CAREER award in 2009, the O. Hugo Schuck Best Paper Award from the American Automatic Control Council (AACC) in 2010, the Best Paper in Mechatronics from the TC-Mechatronics of ASME Dynamic Systems and Control Division in 2018. He is a Technical Editor of IEEE/ASME Transactions on Mechatronics (2014), Control Engineering Practice (2016), and Mechatronics (2015), and past Associate Editor of ASME Journal of Dynamic Systems, Measurement and Control (2011-2014). He is a fellow of ASME.
Talk Title: High-speed Scanning Probe Microscope Imaging and Broadband Nanomechanical Mapping for Characterizing Nanoscale Dynamic Processes of Soft Materials