Nanometrology 2020 International Conference and Exhibition
23 - 25 Jun 2020 | Paris France
Lionel Cervera Gontard has developed his professional career in technology companies, R+D centers and universities. He holds a BsC degree in Physics and an MsC in Microelectronics from the University of Seville, Spain. He has been a member of the Royal Microscopy Society, a Fellow of the Spanish Microscopy Society and the Spanish Association for Artificial Intelligence. He has been recipient of several awards including entrepreneurship awards. In 2001 he participated on an spin-off devoted to the design of smart imaging devices including state-of-the-art silicon retinas. In 2007 Lionel got a PhD in the Department of Materials Science and Metallurgy of the University of Cambridge (United Kingdom) focused on the characterization of catalytic nanomaterials applying and developing advanced techniques of electron microscopy. After his PhD he moved to the Danish Technical University (Denmark) with an HC Oersted Fellowship “for attracting Highly Talented researchers”. He was part of the founding team of the Center for Electron Nanoscopy (CEN), the most advanced European center in electron microscopy at the time. In 2010, he spent a year at the University of Oxford working on the prototyping of radhard sensors for electrons. Lionel rejoined the Spanish research system as part of the European H2020 project Al-NanoFunc (2011-2014) for establishing an advanced electron microscopy facility. Nowadays, Lionel is funded at the University of Cádiz for carrying research in applied metrology using Computer Vision, with a strong focus on technology transfer with companies in the context of the Industry 4.0 paradigm. Currently he leads a R&D project that involves the development of neuromorphic sensors for efficient nanometrology in the field of electron microscopy.
Talk title: Advances in nanometrology with electron microscopy