Nanometrology France 2017 Conference and Exhibition

NanoMetrology 2017
28 Jun - 30 Jun 2017 | Paris - France
NanoMetrology France 2017 Conference & Exhibition - Paris, France


Nanometrology France 2017 International Conference & Exhibition

Nanometrology: is it the next big thing in measurement ?


Metrology, from the Ancient Greek metron (measure) and logos (study of), is the science of measurement. Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today's global economy depends on reliable measurements and tests, which are trusted and accepted internationally. This measurement infrastructure must be extended into the nanoscale and beyond, to bring nanotechnology based products or manufacturing processes successfully and safely into the market place.


The NanoMetrology France event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterization of nanomaterials and realization of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology. The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterization of nanomaterials, nanosystems, and nanodevices at the nanometer scale. The event topics include, but not limited to:


  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)

  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings

  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems

  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)

  • Divulgation of good laboratory practice and traceability in nanoscale metrology

  • Modeling and simulations for nanometrology

  • Society and regulation issues


In addition focused sessions/ symposia are organized by our partners including:


Focused session on NanoModelling

Chair: Prof. James M Hill, School of Mathematical Sciences, The University of Adelaide, Australia


Focused session on reliability of nanomaterials' size measurement


Dr. Goerges Favre, National Metrology and Testing Laboratory (LNE- Trappes), France

Dr Nicolas Feltin, National Metrology and Testing Laboratory (LNE- Trappes), France


Focused session on Electron microscopy in nanotechnology

Chair: Prof. Peter van Aken, Max Planck Institute for Solid State Research Heisenbergstr, Stuttgart-Germany


Focused session on Standards, Metrology and Quality Control of Carbon Materials

Chair: Dr. Pedro M. Da Costa, Physical Science and Engineering Division, KAUST- Saudi Arabia


Focused session on Nanosafety/Nanotoxicity

Chair: Prof Victor Puntes, ICN2 – Catalan Institute of Nanoscience and Nanotechnology – Spain


Please click here for the above topics details.



General Chairs
Dr. Georges Favre-NanoMetrology France 2017 Conference & Exhibition - Paris, France
Business Developper- Laboratoire National de métrologie et d’Essais LNE, France
Prof. Jacques Jupille-NanoMetrology France 2017 Conference & Exhibition - Paris, France
Institut des Nanosciences de Paris-Université Pierre et Marie Curie (UPMC) – CNRS Paris, France
Keynote Speakers
University of South Australia, Australia
Max-Planck Institute, Germany
Institut des Nanosciences de Paris-Université Pierre et Marie Curie (UPMC) – CNRS Paris, France
Media Partners