Nanometrology 2018 International Conference and Exhibition
27 Jun - 29 Jun 2018 | Paris - France
Metrology, from the Ancient Greek metron (measure) and logos (study of), is the science of measurement. Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today's global economy depends on reliable measurements and tests, which are trusted and accepted internationally. This measurement infrastructure must be extended into the nanoscale and beyond, to bring nanotechnology based products or manufacturing processes successfully and safely into the market place.
The 4th edition of NanoMetrology 2018 event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterization of nanomaterials and realization of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology. The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterization of nanomaterials, nanosystems, and nanodevices at the nanometer scale.
Click here for the conference topics details.
In addition to these main conference themes/ sessions, the following focused sessions will run in parallel.
Dimensional metrology of nanoparticles (NP) in complex media
Dr. Carine Chivas-Joly, National Metrology and Testing Laboratory (LNE- Trappes), France
Mathematical Modelling in Nanoscience and Nanotechnology
Prof.Natalie Thamwattana, University of Newcastle, Australia
Prof. Duangkamon Baowan, Mahidol University, Thailand
Prof. James M Hill, University of South Australia, Australia