The NanoMetrology 2018 conference topics include, but not limited to:

 

• Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
• Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
• Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
• Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
• Divulgation of good laboratory practice and traceability in nanoscale metrology
• Modeling and simulations at the nanoscale
• Society and regulation issues 

 

In addition to these main conference themes/ sessions, the following focused sessions will run in parallel.

 

Focused sessions

 

Dimensional metrology of nanoparticles (NP) in complex media

Chair:

Dr. Carine Chivas-Joly, National Metrology and Testing Laboratory (LNE- Trappes), France

 

Description: The dimensional metrology of nanoparticles (NP) in complex media is a major challenge for industry (e.g. cosmetics, food, polymers, health etc.) to control performances of products and answer regulatory requirements, for risk assessment agencies with environmental (water, soil etc.) and biological samples or authorities to enable reliable control of regulation (labeling in EU for example). But no single technique currently allows performing size and size distribution measurements leading to reliable and accurate data. Only few Reference Materials are indeed today available with matrices most of the times non representative of real samples and direct consequences on uncontrolled bias due to the increase of media complexity. This session intends to address the topic of metrological tools for NP characterization in complex media including sample preparation methods and limitation of experimental techniques. This session organized in link with the Nanometrology Club (French network dedicated to characterization at the nanoscale) will be followed by a roundtable to identify priority needs regarding metrological developments.

 

The following are the session topics:

• Dimensional metrology of nanoparticles in complex media (biological, cosmetics, food, Polymers, etc)
• Nanoparticles size distribution
• Reference materials
• Metrological tools
• Samples preparation methods
• Nanoparticles measurment techniques (SEM, TEM, AFM, SAXS, DLS, A4F, MALS,etc)
• Nano-measurment accuracy and precision

 

Mathematical Modelling in Nanotechnology

Chairs:

Prof.Natalie Thamwattana, University of Newcastle, Australia

Prof. Duangkamon Baowan, Mahidol University, Thailand

Prof. James M Hill, University of South Australia, Australia

 

Description: Mathematical modelling in nanoscience and nanotechnology is an emerging area of research where analytical and computational tools and techniques in mathematical sciences are used to investigate arrays of problems in nanoscience and nanotechnology. Modelling can generate important new insights into complex processes, and reveal optimal parameters or situations that might otherwise be difficult or costly to obtain, especially through experimentation. The ability to predict the performance of nanomaterials under various conditions can lead to successful development of nanoscale devices for applications, such as clean energy and medical technology. This session aims to gather mathematicians, engineers and scientists who are interested in learning and discussing the latest development and new directions in the use of mathematical formulation and computational approaches to enhance the properties of nanomaterials in various applications. The programme of this session will showcase the state-of-the-art of this fundamental field of research with international experts and participants will have the opportunity to present their most recent advances in the field.