Nanometrology France 2016 Conference and Exhibition

NanoMetrology 2016
01 Jun - 03 Jun 2016 | Paris - France
NanoMetrology France 2016 Conference & Exhibition - Paris, France



Nanometrology France 2016 International Conference & Exhibition

Nanometrology: is it the next big thing in measurement ?


Metrology, from the Ancient Greek metron (measure) and logos (study of), is the science of measurement. Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Today's global economy depends on reliable measurements and tests, which are trusted and accepted internationally. This measurement infrastructure must be extended into the nanoscale and beyond, to bring nanotechnology based products or manufacturing processes successfully and safely into the market place.


The NanoMetrology France event deals with the advancements in all the metrological aspects related to nanoscience and nanotechnology. It is open to all the areas connected to both theoretical and experimental aspects of metrology at the nanometer scale, from new methodologies for the quantitative characterization of nanomaterials, to new results in fields of characterization of nanomaterials and realization of nanometrological standards, which represent a key issue for making possible a successful technological transfer of nanotechnology. The aim of this event is to offer an opportunity to academicians, innovators and industrials to share, and divulge new methods, techniques and instrumentations, for metrology and characterization of nanomaterials, nanosystems, and nanodevices at the nanometer scale. The event topics include, but not limited to:


  • Methodologies for the quantitative characterization of physical and chemical parameters of nanomaterials (AFM, STM, SEM, TEM, Mass spectrometry, etc)
  • Extension and standardization of characterization Methodologies at the nanometer scale (engineered nanoparticles, nanobiotechnologies, nanoelectronics, thin films/nanocoatings
  • Presentation of innovative studies reporting new results in the characterization of nanomaterials and nanosystems
  • Definition and realization of standards for nanometer scale characterizations (reference materials, measurement standards, etc)
  • Divulgation of good laboratory practice and traceability in nanoscale metrology
  • Modeling and simulations for nanometrology
  • Society and regulation issues


Please click here for the above topics details.


NanoMetrology France 2016 Symposia


In parallel to the conference sessions, we are organizing the following focused symposia:


Symposium 1: Nanospectroscopy

Chair: Prof. Pierre-Michel Adam University of technology of Troyes, France

Symposium 2: Detection, location & quantification of nanomaterials and by-product released from nano-enable products

Chairs: Jean-Yves Bottero, CNRS-CEREGE-France and DUKE University- USA


General Chairs
Prof. Pierre-Michel Adam-NanoMetrology France 2016 Conference & Exhibition - Paris, France
University of technology of Troyes, France
Prof. Jean-Yves Bottero-NanoMetrology France 2016 Conference & Exhibition - Paris, France
CNRS-CEREGE-France and DUKE University, USA
Prof. Jupille Jacques-NanoMetrology France 2016 Conference & Exhibition - Paris, France
Institut des Nanosciences de Paris-Université Pierre et Marie Curie (UPMC) – CNRS Paris, France
Keynote Speakers
Institute of Applied Physics and Interdisciplinary Nanoscience Center Hamburg, Hamburg University, Germany
Department of Applied Physics Osaka University - Japan
Nanomechanics Group, School of Mathematical Sciences, The University of Adelaide, Australia
School of Chemistry, University of Manchester - United Kingdom
Main Sponsors
Global Partners
Media Partners